“…Error-corrected scattering (S-) parameters of a microwave two-port device can be obtained by using a proper calibration procedure such as the thru-reflect-line (TRL) [1], multiline TRL [2], and the thrureflect-match [3]. To achieve the same goal, de-embedding line-line techniques can be applied for characterization of S-parameters of a twoport device [4][5][6][7], which is our main concern in this study, in addition to the determination of line impedance [8,9], line propagation constant [10][11][12][13], and complex permittivity/permeability of sample-loaded line [14][15][16][17][18][19][20][21].…”