Budget-based reliability management to handle impact of thermal issues in 16nm technology

Ahn, Jong Hyun; Cooksey, John P.; Navale, Nitin; Lo, Nick; Yeh, Ping-Chin; Chang, Jonathan

doi:10.1109/irps.2016.7574538

2016 IEEE International Reliability Physics Symposium (IRPS) 2016

DOI: 10.1109/irps.2016.7574538

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Budget-based reliability management to handle impact of thermal issues in 16nm technology

Jong Hyun Ahn

John P. Cooksey

Nitin Navale

et al.

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Product-level reliability estimator with budget-based reliability management in 16nm technology

Ahn

Navale

et al. 2017

2017 IEEE International Reliability Physics Symposium (IRPS)

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Budget-based reliability management to handle impact of thermal issues in 16nm technology

Cited by 4 publications

References 7 publications

Product-level reliability estimator with budget-based reliability management in 16nm technology

Product-level reliability estimator with budget-based reliability management in 16nm technology

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