Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs

Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf

doi:10.3390/electronics13020303

Electronics

2024

DOI: 10.3390/electronics13020303

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Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs

Paolo Bernardi,

Augusto Maria Guerriero,

Giorgio Insinga

et al.

Abstract: This paper describes a hardware/software strategy for the effective and efficient management of several distributed Memory Built-In Self-Test (MBIST) units orchestrated by a single CPU to enable the parallel testing of several memory banks. Experimental testing of the implementation on an Infineon chip shows up to a 25% test time reduction compared to traditional strategies, especially in cases for which there are a large number of failures affecting several banks. Additionally, it permits balanced failure col… Show more

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Cited by 2 publications

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Research on Storage Structure Design and Performance Optimization Strategy of Embedded System for Low-Capacity Storage Units

Hu,

Xiang

2024

Applied Mathematics and Nonlinear Sciences

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Embedded systems have attracted great attention with their unique information processing ability and human-computer interaction ability, and how to improve the processing efficiency of embedded systems for low-capacity storage units has become a key topic of current research. Based on the data storage structure characteristics and hardware devices of embedded systems, we complete the task of storage structure design for embedded systems and describe the interaction mechanism of Cache storage mode and low-capacity storage mode. Using the POSE algorithm, we optimize the execution efficiency and module energy overhead in the storage structure of the embedded system and test and optimize the embedded system. The low-capacity storage mode has fewer physical block erasures than the Cache storage mode, and the response time is 15-50 ms less. Similarly, the PEOS algorithm has advantages in the optimization of the energy overhead of the embedded system, which ranges from 0 to 0.23 × 104. This study can effectively improve the execution efficiency and energy overhead of the storage, which is of great significance for its further development.

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Research on Storage Structure Design and Performance Optimization Strategy of Embedded System for Low-Capacity Storage Units

Hu,

Xiang

2024

Applied Mathematics and Nonlinear Sciences

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Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips

Bernardi,

Filipponi,

Iaria

et al. 2024

Electronics

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Modern embedded nanoelectronic devices, particularly in safety-critical sectors, require high dependability throughout their lifecycle. To address this, designers have started integrating extra circuitry for on-device self-testing, such as the Logic Built-In Self-Test (LBIST). However, while automatic test equipment (ATE) ensures exhaustive testing during manufacturing, in-field testing capabilities are limited. This study introduces a novel methodology for in-field data collection of failure information from LBIST engines and a subsequent logic diagnosis strategy to facilitate failure analysis of field returns. The information is collected from key-on and key-off self-tests, executed by central processing units (CPUs) with a fixed seed and different frequency configurations, primarily addressing transition delay (TRN) faults. The proposed approach capitalizes on the constrained in-field configurability of LBIST and does not require a custom architecture, making it highly practical and readily applicable to real-world devices. The logic diagnosis strategy significantly reduces the number of candidate faults by exploiting the first failing pattern index found during the in-field testing and data collection. Reducing fault candidates could enhance accuracy during failure analysis, especially when field return devices exhibit a “No Trouble Found” (NTF) behavior. The experimental results are reported for ITC’99 benchmarks and an industrial automotive system-on-chip (SoC) produced by STMicroelectronics, with about 20 million gates.

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Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs

Cited by 2 publications

References 17 publications

Research on Storage Structure Design and Performance Optimization Strategy of Embedded System for Low-Capacity Storage Units

Research on Storage Structure Design and Performance Optimization Strategy of Embedded System for Low-Capacity Storage Units

Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips

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