Calculating small-angle scattering intensity functions from electron-microscopy images

Abstract

We outline procedures to calculate small-angle scattering (SAS) intensity functions from 2-dimensional electron-microscopy (EM) images for two types of scattering systems.

Multi-task scattering-model classification and parameter regression of nanostructures from small-angle scattering data

“…We call this the SAS-55M-20k dataset, and we provide both training and test sets through this publication to facilitate further work on applying ML and other computational methods to 1-D SAS intensities with known parameters. Details on how to download the SAS-55M-20k dataset 5 can be found at .…”

“…Thereby, we create the SAS-55M-20k dataset, consisting of 1.1 million theoretical 1-D SAS intensities with corresponding discrete scattering-model classes and their continuous parameters. 5 This dataset is made publicly available alongside this paper, including the training and test splits to ease benchmarking of any future models trained on this dataset. Full details on the construction and composition of the dataset can be found in the ESI †.…”