Carbonization in boron-ion-implanted polymethylmethacrylate as revealed from Raman spectroscopy and electrical measurements

Kavetskyy, Taras; Nowak, Jakub; Borc, J.; Rusnák, Jaroslav; Šauša, O.; Степанов, А. Л.

doi:10.1080/00387010.2015.1044113

Cited by 12 publications

(18 citation statements)

References 25 publications

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“…The observed increasing absorbance for the B:PMMA samples in the course of the ion implantation should be also interpreted as the signature on the formation of carbonaceous clusters which are plausibly confirmed by slow positrons [36]. Figure 7 shows the Raman spectra of the investigated samples excited by 514 nm and 785 nm diode laser lines [43]. Identification of the observed Raman bands has been reported in [43].…”

Section: Optical Spectroscopy Datamentioning

confidence: 69%

“…Figure 7 shows the Raman spectra of the investigated samples excited by 514 nm and 785 nm diode laser lines [43]. Identification of the observed Raman bands has been reported in [43]. The ion-irradiation-induced structural changes as revealed from Raman study can be summarized as follows.…”

Section: Optical Spectroscopy Datamentioning

confidence: 89%

“…Room temperature Raman spectra were recorded using a Renishaw Raman inVia Reflex spectrometer in the 400-3800 cm −1 range with a spectral resolution of ≤1 cm −1 [43]. The 514 nm Modu-Laser Stellar-REN Pro 514/50 Argon Laser and 785 nm Near Infrared Diode Laser lines were applied as the excitation source.…”

Section: Raman Spectroscopy Measurementsmentioning

confidence: 99%

“…The electrical measuring system was developed at the IPSAS (Slovak Republic) [43]. The measurement of current vs. voltage (I-V) by transient method or DC method was used in this experiment.…”

Section: Electrical Measurementsmentioning

confidence: 99%

“…The NI PCI 6229 DAQ card was applied [44]. The electrical DC measurement setup used and detail description of basic parameters are reported elsewhere [43].…”

Section: Electrical Measurementsmentioning

confidence: 99%

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Ion-Irradiation-Induced Carbon Nanostructures in Optoelectronic Polymer Materials

Kavetskyy¹,

Степанов²

2016

Radiation Effects in Materials

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The recent results obtained on the ion-irradiation-induced carbon nanostructures in optoelectronic polymer materials exemplified by boron-ion-implanted polymethylmethacrylate " PMM" with an energy of keV, ion doses from . × to . × ions/ cm , and current density < μ"/cm are reviewed. The positron annihilation spectroscopy slow positron beam spectroscopy based on Doppler broadening of positron annihilation gamma rays as a function of incident positron energy and positron annihilation lifetime at a positron energy of . keV, and temperature-dependent positron annihilation lifetime spectroscopy , optical UV-visible spectroscopy, Raman spectroscopy, electrical current voltage measurements, and nanoindentation test are chosen as the main experimental tools for the investigation of low-energy ion-induced processes in " PMM". The formation of carbon nanostructures is confirmed for the samples irradiated with higher ion fluences > ions/cm and the experimental results of the comprehensive study are found to be in a good agreement with SRIM stopping and range of ions in matter simulation results.

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Section: Optical Spectroscopy Datamentioning

confidence: 69%

Section: Optical Spectroscopy Datamentioning

confidence: 89%

Section: Raman Spectroscopy Measurementsmentioning

confidence: 99%

Section: Electrical Measurementsmentioning

confidence: 99%

“…The NI PCI 6229 DAQ card was applied [44]. The electrical DC measurement setup used and detail description of basic parameters are reported elsewhere [43].…”

Section: Electrical Measurementsmentioning

confidence: 99%

See 3 more Smart Citations

Ion-Irradiation-Induced Carbon Nanostructures in Optoelectronic Polymer Materials

Kavetskyy¹,

Степанов²

2016

Radiation Effects in Materials

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Probing Vibrational Strong Coupling of Molecules with Wavelength‐Modulated Raman Spectroscopy

Menghrajani

Chen

Dholakia

et al. 2021

Advanced Optical Materials

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that are shifted from that of the incident laser light. In particular, peaks appear in the spectrum of the scattered light that correspond to vibrational resonances of the molecules/materials of which the sample is composed. These spectral peaks form the characteristic fingerprints of the molecules/materials under investigation; the study of such spectra is known as Raman spectroscopy and has become a well-established and powerful analytic technique. [5] Unfortunately, Raman signals are very weak with cross-sections of order 10 −30 cm 2 for non-resonant Raman and 10 −24 cm 2 for resonant Raman. [6] In many situations, these very weak signals are swamped by light produced by other processes, notably fluorescence, which can be many orders of magnitude stronger than the Raman signal. Background fluorescence is particularly problematic when the samples to be investigated are dyes/pigments, [3] for example, resonant Raman, [6] and also when they involve metals. [7] In both cases, fluorescence can be so significant as to mask the desired Raman signals.Various approaches have been adopted to try and deal with the background problem, [8,9] and they fall into three broad categories. First, post-processing can be used to try and subtract the background. [10,11] Although appealing and commonly used, this approach has its drawbacks, especially in that it does not overcome the problem of noise in the background signal. Second, one can move to the time-domain. Raman scattering is an instantaneous process, whereas fluorescence occurs over a protracted time-scale; however, this approach comes at a very significant increase in complexity. [12] Third, a differential approach can be adopted. Here, the idea is to modify the way the data are acquired so as to directly filter out the background and its associated noise. A number of such approaches have been successfully deployed. One technique is based on acquiring spectra for slightly different grating settings in the spectrometer. [7] Another approach is to subtract two Raman spectra obtained with different polarization configurations. [13] Then, there are techniques that make use of the fact that if the pump wavelength is shifted the Raman peaks will also move in wavelength, but the fluorescence will not. Spectra acquired at two or more closely spaced pump wavelengths can thus be processed to provide a differential signal that largely eliminates the background; [14] this technique is known as shifted excitation Raman difference spectroscopy (SERDS). We make use of one variant of this approach here, that of wavelength-modulated Raman spectroscopy (WMRS). WMRS [15] is a significant improvement on Raman spectroscopy is a powerful technique that enables fingerprinting of materials, molecules, and chemical environments by probing vibrational resonances. In many applications, the desired Raman signals are masked by fluorescence, either from the molecular system being studied, or from adjacent metallic nanostructures. Here, it is shown that wavelength-modulated Raman spectroscopy provides...

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Comparison of GO and polymer microcapacitors prepared by ion beam writing

Malínský

Romanenko

Havránek

et al. 2020

Surface & Interface Analysis

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Carbon beam writing was employed as a method for maskless production of microscale capacitors in both insulating graphene oxide (GO) and poly(methyl methacrylate) (PMMA) matrix. The GO and PMMA foils were irradiated using a 5-MeV C 3+ beam with micrometer scale resolution. As follows, the shape of the created microstructures and compositional changes was studied using the scanning electron microscopy/energy-dispersive X-ray spectroscopy method (SEM/EDS). The structural and compositional progression was characterized by Raman spectroscopy, Rutherford backscattering spectroscopy (RBS), and elastic recoil detection analysis (ERDA) spectroscopy. The improvement of the prepared structures' electrical properties was also studied, and it can be concluded that carbon irradiation leads to the removal of oxygen and hydrogen and to growth of the carbon domains, which is connected with the conductivity increase of the irradiated parts and capacitance of the final products in the order of pF.

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Carbonization in boron-ion-implanted polymethylmethacrylate as revealed from Raman spectroscopy and electrical measurements

Cited by 12 publications

References 25 publications

Ion-Irradiation-Induced Carbon Nanostructures in Optoelectronic Polymer Materials

Ion-Irradiation-Induced Carbon Nanostructures in Optoelectronic Polymer Materials

Probing Vibrational Strong Coupling of Molecules with Wavelength‐Modulated Raman Spectroscopy

Comparison of GO and polymer microcapacitors prepared by ion beam writing

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