“…The composition of the fabricated CdSe/TiO 2 NTs was further investigated by XRD. As indicated in Figure a, all samples exhibit diffraction peaks at 2θ = 25.3, 37.8, 48.0, 53.9, 55.0, 68.8, and 75.1°, corresponding to (101), (004), (200), (105), (211), (116), and (215) crystallographic planes of anatase TiO 2 NTs (JCPDS 21-1272) . After CdSe was modified, new diffraction peaks at 2θ = 42.0 and 49.7° appear, corresponding to the (220) and (311) crystallographic planes of cubic sphalerite CdSe (JCPDS 19-0191), respectively .…”