2016 China Semiconductor Technology International Conference (CSTIC) 2016
DOI: 10.1109/cstic.2016.7464068
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Characteristics testing of one-shot switch

Abstract: The characteristics of one-shot switch for the exploding foil initiators system (EFIS) are researched. The switch is fabricated based on micro-fabrication. The palsma temperature of the switching process is analyzed by using the method of the atomic emission spectroscopy double line technique. The shock pressure of Schottky Barrier Diode (SBD) electro-explosive is tested by Polyvinylidene Fluoride (PVDF) film. The problem of ablation on PVDF during testing is solved by using PMMA. The measured peak shock press… Show more

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