Characterization Defects Detected on c-Si PV Modules After Certain Period of Field Exposure

Lagunas, A.R.; Díaz, Juan Sebastián Gómez; Cueli, A.B.; Cuadra, Jorge; Moracho, Jesús María Serrano; Mayo, M. Ezquer

doi:10.4229/28theupvsec2013-4av.5.29

28th European Photovoltaic Solar Energy Conference and Exhibition; 3269-3274 2013

DOI: 10.4229/28theupvsec2013-4av.5.29

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Characterization Defects Detected on c-Si PV Modules After Certain Period of Field Exposure

A.R. Lagunas¹,

Juan Sebastián Gómez Díaz²,

A.B. Cueli³

et al.

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Characterization Defects Detected on c-Si PV Modules After Certain Period of Field Exposure

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