2014
DOI: 10.18257/raccefyn.85
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Characterization of Al-Zr, Al-Hf and Al-Ce-pillared vermiculites by X-ray photoelectron spectroscopy

Abstract: X-ray photoelectron spectroscopy was used to establish the relative concentration and the chemical environment of modifying species in a series of vermiculites pillared with mixed precursors of Al-Zr, Al-Hf and Al-Ce. The binding energies observed provided evidence that zirconium and hafnium are most likely found as Zr-O(H)-and/or Zr-Siand HfO 2 , displaying a larger dispersion on the vermiculite surface compared with cerium species (Ce 2 O 3 ), which are mainly found inside clay aggregates. On the one hand, t… Show more

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“…Indicating that possibly all the Ce in the structure is formed Ce-Al-or Ce-Si-O species [43] which would explain the increase in acidic properties when this cation is used. These results found by XPS are like those reported in other materials, as well as in pillared clay minerals [39,44].…”
Section: Structure and Texturesupporting
confidence: 90%
“…Indicating that possibly all the Ce in the structure is formed Ce-Al-or Ce-Si-O species [43] which would explain the increase in acidic properties when this cation is used. These results found by XPS are like those reported in other materials, as well as in pillared clay minerals [39,44].…”
Section: Structure and Texturesupporting
confidence: 90%
“…Adicionalmente, se observa para las dos series de OM que el contenido de CeO2 obtenido por FRX se encuentra por encima del valor establecido durante la síntesis, este comportamiento está relacionado con el efecto matriz entre el MgO-CeO2, generando una sobreestimación en el valor real del contenido de Ce en los sólidos [112,113,124], por este motivo no se consideraron lo datos de FRX para validar las relaciones molares de los Ni, Mg, Ca y Al de los OM.…”
Section: Análisis Químico Elemental De Los Omunclassified