2008
DOI: 10.1016/j.apsusc.2008.05.013
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Characterization of environmental nanoparticles

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Cited by 21 publications
(15 citation statements)
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“…This SIMS analysis of layer formation was particularly effective when combined with zeta‐potential measurements. Furthermore, SIMS analysis was used to characterize environmental NPs from the atmosphere with two distinct size distributions (20 and 100 nm) (Fukuhara et al, ). Interestingly, size‐dependent characteristic peaks were observed: C + , O + , Si + , and SiH 3 peaks from 20 nm, presumably from fuels and engine oils, and NH 4 + , Na + , K + , and Ca + from 100 nm, presumably from diesel exhaust particles.…”
Section: Probing Nanoparticles By Tof‐simsmentioning
confidence: 99%
“…This SIMS analysis of layer formation was particularly effective when combined with zeta‐potential measurements. Furthermore, SIMS analysis was used to characterize environmental NPs from the atmosphere with two distinct size distributions (20 and 100 nm) (Fukuhara et al, ). Interestingly, size‐dependent characteristic peaks were observed: C + , O + , Si + , and SiH 3 peaks from 20 nm, presumably from fuels and engine oils, and NH 4 + , Na + , K + , and Ca + from 100 nm, presumably from diesel exhaust particles.…”
Section: Probing Nanoparticles By Tof‐simsmentioning
confidence: 99%
“…For example, maternal exposure to dioxin induced atrophy of thymus and decrease of thymocytes in the offspring (Camacho et al, 2004;Mustafa et al, 2009). Recently, maternal exposure to nanoparticles (defined as substances measuring 1-100 nm in at least one dimension) in nanotechnology (Kessler, 2011) or to those suspended in the air (Fukuhara, et al, 2008), has become a major focus in research on environmental effects on human health.…”
Section: Introductionmentioning
confidence: 99%
“…Rapid non-microscopic approaches to the identification of particle composition are desired to confirm that the sized materials are composed of the material in question. Hyphenated methods such as ES-DMA–inductively coupled plasma mass spectroscopy (ICP-MS) ( Carazzone et al 2008 ), ES-DMA–time of flight secondary ion mass spectroscopy (TOF-SIMS) ( Fukuhara et al 2008 ), and FFF–ICP-MS ( Stolpe et al 2005 ) have recently been applied; however, additional work is warranted.…”
Section: Research Needs In Nano-object Count Metrologymentioning
confidence: 99%