Characterization of granularity and redundancy for SRAMs for optimal yield-per-area

Cha, Jaehan; Gupta, Sandeep

doi:10.1109/iccd.2008.4751865

2008 IEEE International Conference on Computer Design 2008

DOI: 10.1109/iccd.2008.4751865

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Characterization of granularity and redundancy for SRAMs for optimal yield-per-area

Jaehan Cha

Sandeep Gupta

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Cited by 8 publications

References 28 publications

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Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates

Chul

Gupta²

2011

2011 Asian Test Symposium

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Characterization of granularity and redundancy for SRAMs for optimal yield-per-area

Cited by 8 publications

References 28 publications

Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates

Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates

Optimal Redundancy Designs for CNFET-Based Circuits

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