Characterization of small single photon avalanche diode fabricated using standard 180 nm CMOS process for digital SiPM

Oh, Jinseok; Jeong, Hakcheon; Lee, Min Sun; Kwon, Inyong

doi:10.1016/j.net.2024.03.006

Nuclear Engineering and Technology

2024

DOI: 10.1016/j.net.2024.03.006

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Characterization of small single photon avalanche diode fabricated using standard 180 nm CMOS process for digital SiPM

Jinseok Oh,

Hakcheon Jeong,

Min Sun Lee

et al.

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Characterization of small single photon avalanche diode fabricated using standard 180 nm CMOS process for digital SiPM

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References 31 publications

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