2024 IEEE European Solid-State Electronics Research Conference (ESSERC) 2024
DOI: 10.1109/esserc62670.2024.10719583
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Characterizations and Framework Modeling of Bulk MOSFET Threshold Voltage Based on a Physical Charge-Based Model Down to 4 K

Hao Su,
Yunfeng Xie,
Yuhuan Lin
et al.
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