Characterizing the Nonlinear Optical Properties of<scp>2D</scp>Materials by Double<scp>4f</scp>Nonlinear Imaging System with Phase Object and Four‐Wave‐Mixing Microscopy

Li, Zhongguo; Song, Yinglin

doi:10.1002/9783527838288.ch4

Two‐Dimensional Materials for Nonlinear Optics 2023

DOI: 10.1002/9783527838288.ch4

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Characterizing the Nonlinear Optical Properties of2DMaterials by Double4fNonlinear Imaging System with Phase Object and Four‐Wave‐Mixing Microscopy

Zhongguo Li,

Yinglin Song

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Cited by 4 publications

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Exploring the impact of thin film thicknesses on the linear and nonlinear optical properties of ZrO2 thin film

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Influence of d-d transition electrons and thickness variations on the excited-state optical properties: Nonlinear optical characterization of Cr2O3 thin film

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Characterizing the Nonlinear Optical Properties of2DMaterials by Double4fNonlinear Imaging System with Phase Object and Four‐Wave‐Mixing Microscopy

Cited by 4 publications

References 62 publications

Exploring the impact of thin film thicknesses on the linear and nonlinear optical properties of ZrO2 thin film

Exploring the impact of thin film thicknesses on the linear and nonlinear optical properties of ZrO2 thin film

A novel approach to the fabrication of photonic XOR and XNOR gates employing a 2:1 all-optical multiplexer made of nonlinear Kerr type materials

Influence of d-d transition electrons and thickness variations on the excited-state optical properties: Nonlinear optical characterization of Cr2O3 thin film

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