2010
DOI: 10.1117/1.3386514
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Charge diffusion in the field-free region of charge-coupled devices

Abstract: The potential well in back-illuminated charge-coupled devices ͑CCDs͒ does not reach all the way to the back surface. Hence, light that is absorbed in the field-free region generates electrons that can diffuse into neighboring pixels and thus decreases the spatial resolution of the sensor. We present data for the charge diffusion from a near point source by measuring the response of a back-illuminated CCD to light emitted from a submicron diameter glass fiber tip. The diffusion of electrons into neighboring pix… Show more

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Cited by 11 publications
(10 citation statements)
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“…defocus), we attributed to a MTF degradation by the detector. This value of 1 for the FWHM equivalent of the MTF degradation kernel, or about 2/3 of a pixel, is not uncommon and matches values measured in dedicated experiments with similar thinned detectors (Widenhorn et al 2010;van Dam et al 2004). This issue could not be remedied with the current EEV-CCD39.…”
Section: Wfs Ccd Pixel Modulation Transfer Functionsupporting
confidence: 81%
See 1 more Smart Citation
“…defocus), we attributed to a MTF degradation by the detector. This value of 1 for the FWHM equivalent of the MTF degradation kernel, or about 2/3 of a pixel, is not uncommon and matches values measured in dedicated experiments with similar thinned detectors (Widenhorn et al 2010;van Dam et al 2004). This issue could not be remedied with the current EEV-CCD39.…”
Section: Wfs Ccd Pixel Modulation Transfer Functionsupporting
confidence: 81%
“…Through a phenomenon called pixel edge diffusion, there is a finite probability that a photon falling within the boundaries of a pixel be detected by a neighbouring pixel instead (see e.g. Widenhorn et al (2010)).…”
Section: Wfs Ccd Pixel Modulation Transfer Functionmentioning
confidence: 99%
“…Since the electric field within the device is defined by and concentrated between the two electrodes (ITO substrate and AFM tip), it is orthogonal to the in‐plane/lateral hole transport . Given negligible in‐plane electric‐field, diffusion of photogenerated carriers would thus be expected to follow an exponential decay with lateral distance from the excitation source . By fitting an exponential function to each set of data, we can extract the decay coefficients to semiquantitatively compare their respective efficiencies of long‐range photocarrier transport.…”
Section: Resultsmentioning
confidence: 99%
“…38 Given negligible in-plane electric-field, diffusion of photogenerated carriers would thus be expected to follow an exponential decay with lateral distance from the excitation source. 39 By fitting an exponential function to each set of FIGURE 4 Schematic of the photoconductive AFM measurement setup (a), in which laser illumination from below can be focused on a spot directly on the scan region or displaced from it. For the measurements on the aligned device, the scan region was on the edge of a large fiber as illustrated in (b), and the photocurrent map under direct illumination is shown in (c).…”
Section: Full Papermentioning
confidence: 99%
“…Beyond optics, the detectors also degrade the spatial resolution of stellar images through charge disturbances processes such as CTI (Short et al 2013;Massey et al 2014), "brighterfatter" (Guyonnet et al 2015), and diffusion (Widenhorn 2010). Several tests are being carried out by ESA to characterize such effects for the charge coupled devices (CCD) of PLATO cameras, so at the present date no formal specifications for the corresponding parameters are available.…”
Section: Point Spread Functionmentioning
confidence: 99%