2013
DOI: 10.7567/apex.6.125801
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Charge Dynamics and Electronic Structures of Monolayer MoS2Films Grown by Chemical Vapor Deposition

Abstract: THz absorption and spectroscopic ellipsometry were used to investigate the charge dynamics and electronic structures of chemical-vapor-deposited monolayer MoS2 films. THz conductivity displays a coherent response of itinerant charge carriers at zero frequency. Drude plasma frequency (∼7 THz) decreases with decreasing temperature while carrier relaxation time (∼26 fs) is almost temperature independent. The absorption spectrum of monolayer MoS2 shows a direct 1.95 eV band gap and charge transfer excitations that… Show more

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Cited by 88 publications
(76 citation statements)
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“…Deep in the ultraviolet (UV) region, the dielectric function shows a series of absorption peaks or fine features separated by about 0.7 eV. Our high precision dielectric function data facilitates the accurate optical properties analysis, and the results agree well with previous work including ellipsometry [24], absorption measurements [8], PL measurements [9], and theoretical calculation [16][17][18].…”
Section: Introductionsupporting
confidence: 83%
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“…Deep in the ultraviolet (UV) region, the dielectric function shows a series of absorption peaks or fine features separated by about 0.7 eV. Our high precision dielectric function data facilitates the accurate optical properties analysis, and the results agree well with previous work including ellipsometry [24], absorption measurements [8], PL measurements [9], and theoretical calculation [16][17][18].…”
Section: Introductionsupporting
confidence: 83%
“…The reported experimental studies focused on photoluminescence (PL), absorbance, optical contrast, and photoconductivity in the vicinity of the K point in its Brillouin zone, and the corresponding spectral ranges are rather limited [8,9,19,[21][22][23]. On the other hand, there are limited reports on the broad band optical dielectric function of monolayer MoS 2 in the published literature [24], and it is expected to be distinct from that of bulk MoS 2 . Not until very recently could large-area monolayer MoS 2 with sample sizes up to millimeters be grown by chemical vapor deposition (CVD) [25][26][27][28].…”
Section: Introductionmentioning
confidence: 99%
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“…4c) likely arises from dielectric environment differences between bulk and single layer specimens. The extinction coefficient, k, in the region 3 to 4.5 eV is about ∼2.5…3.5, which is comparable with that (∼3.2) of Yim et al [14] for ultrathin CVD MoS 2 and with the data of Li et al [15] for TMDs, but much lower than that (∼5.1) of Shen et al [39]. The higher coefficient, k, could be a result of sample structural quality or the way it was extracted from their four-phase ellipsometric model [39].…”
Section: Resultssupporting
confidence: 79%
“…The extinction coefficient, k, in the region 3 to 4.5 eV is about ∼2.5…3.5, which is comparable with that (∼3.2) of Yim et al [14] for ultrathin CVD MoS 2 and with the data of Li et al [15] for TMDs, but much lower than that (∼5.1) of Shen et al [39]. The higher coefficient, k, could be a result of sample structural quality or the way it was extracted from their four-phase ellipsometric model [39]. It is well known that the optical conductivity spectra σ(ω) reflect the main details of the density of electron states within energies close to critical points (CPs) [40].…”
Section: Resultssupporting
confidence: 79%