2022
DOI: 10.1016/j.nima.2022.167213
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Charge sensing properties of monolithic CMOS pixel sensors fabricated in a 65 nm technology

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Cited by 6 publications
(4 citation statements)
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“…The MLR1 test system has been employed in an extensive campaign to validate and characterize the pixel properties both in the laboratory and beam tests [5]. As an example, figures 3 and 4 show preliminary results from lab tests on two MLR1 chips operated and read out by the MLR1 test system.…”
Section: Tests and Preliminary Resultsmentioning
confidence: 99%
“…The MLR1 test system has been employed in an extensive campaign to validate and characterize the pixel properties both in the laboratory and beam tests [5]. As an example, figures 3 and 4 show preliminary results from lab tests on two MLR1 chips operated and read out by the MLR1 test system.…”
Section: Tests and Preliminary Resultsmentioning
confidence: 99%
“…The main goal of the APTS is to explore different pixel designs. The CE65 [8] features a 64×32 pixel matrix with a pixel pitch of 15 µm or a 48×32 pixel matrix with a pixel pitch of 25 µm. Its readout is based on a rolling shutter architecture with 50 µs integration time.…”
Section: Pos(vertex2023)046mentioning
confidence: 99%
“…The digital pixel test structure or DPTS [18] contains a 32 by 32 pixel matrix at 15 𝜇m pitch with an amplifier and discriminator in each pixel and a time encoded digital readout. The CE65 contains a pixel matrix with analog readout in a rolling shutter configuration [19,20]. Figure 11 shows the spectrum of the charge collected on the seed pixel from a 55 Fe radioactive source for different pixel variants and process splits.…”
Section: Pos(pixel2022)083mentioning
confidence: 99%