Chatter Detection in Hot Strip Mill Process based on Modified Independent Component Analysis

Jo, Ha-Nui; Park, Byeong Eon; Ji, Yumi; Kim, Dong-Kuk; Yang, Jeong Eun; Lee, In‐Beum; Hong, Jeong Byeol

doi:10.1109/indin41052.2019.8972064

2019 IEEE 17th International Conference on Industrial Informatics (INDIN) 2019

DOI: 10.1109/indin41052.2019.8972064

|View full text |Cite

Chatter Detection in Hot Strip Mill Process based on Modified Independent Component Analysis

Ha-Nui Jo

Byeong Eon Park

Yumi Ji

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2024

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

Machine Tool Fault Diagnosis Model Based on Discrete Wavelet Transform and Transfer Learning

Kuo,

Liu,

Hsu

et al. 2024

IEEE Sensors J.

View full text Add to dashboard Cite

Machine Tool Fault Diagnosis Model Based on Discrete Wavelet Transform and Transfer Learning

Kuo,

Liu,

Hsu

et al. 2024

IEEE Sensors J.

View full text Add to dashboard Cite

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Chatter Detection in Hot Strip Mill Process based on Modified Independent Component Analysis

Cited by 1 publication

References 19 publications

Machine Tool Fault Diagnosis Model Based on Discrete Wavelet Transform and Transfer Learning

Machine Tool Fault Diagnosis Model Based on Discrete Wavelet Transform and Transfer Learning

Contact Info

Product

Resources

About