ChemInform Abstract: POLARIZATION PHENOMENA OCCURRING AT COPPER/SEMICONDUCTING TELLURIUM LAYER/ELECTROLYTE INTERFACES STUDIED BY RAPID PULSE TECHNIQUES

Darwish, N. A.; Allam, Allam M.

doi:10.1002/chin.198309020

Chemischer Informationsdienst

1983

DOI: 10.1002/chin.198309020

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ChemInform Abstract: POLARIZATION PHENOMENA OCCURRING AT COPPER/SEMICONDUCTING TELLURIUM LAYER/ELECTROLYTE INTERFACES STUDIED BY RAPID PULSE TECHNIQUES

N. A. Darwish

Allam M. Allam

Abstract: Die Kinetik der Primärprozesse und die Art der Leitung an den Phasengrenzen des Systems Cu/Te‐Schicht/Elektrolyt (kathodische Abscheidung der Te‐Schichten auf Cu aus Na2TeO3‐Lösung beim pOH = 3.95) werden durch eine schnelle galvanostatische Rechtwinkel‐Pulsmethode untersucht.

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ChemInform Abstract: POLARIZATION PHENOMENA OCCURRING AT COPPER/SEMICONDUCTING TELLURIUM LAYER/ELECTROLYTE INTERFACES STUDIED BY RAPID PULSE TECHNIQUES

Abstract: Die Kinetik der Primärprozesse und die Art der Leitung an den Phasengrenzen des Systems Cu/Te‐Schicht/Elektrolyt (kathodische Abscheidung der Te‐Schichten auf Cu aus Na2TeO3‐Lösung beim pOH = 3.95) werden durch eine schnelle galvanostatische Rechtwinkel‐Pulsmethode untersucht.

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