Chip-Level ESD-induced noise on internally and externally regulated power supplies

Yang, Xiu; Thomson, Nicholas; Mertens, Robert; Reiman, Collin; Rosenbaum, Elyse

doi:10.23919/eosesd.2017.8073450

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Chip-Level ESD-induced noise on internally and externally regulated power supplies

Cited by 5 publications

References 9 publications

Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD

Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD

Measurement and Simulation of On-Chip Supply Noise Induced by System-Level ESD

Analysis of System-Level ESD-Induced Soft Failures in a CMOS Microcontroller

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