“…Furthermore, residues acting as a strong degradation species, such as O 2 and H 2 O, for field emission [31,33,34] could be effectively eliminated by the brazing process at elevated temperature, giving a very stable emission for prolonged operation at a high current. In addition, the stability and reliability of the vacuum-sealed x-ray tube can be further improved by the active-current control method [22,28]. The active-CCU can allow the gate voltage margin to be extended to over 500 V at a given gate voltage, which strongly compensates the current degradation.…”