Coherent defect spectroscopy with pulsed optically and electrically detected magnetic resonance

Abstract

A short review of the theoretical and experimental foundations of pulsed optically and electrically detected magnetic resonance (pODMR and pEDMR, respectively) as well as their fields of applications is given. In comparison to electron spin resonance spectroscopy, ODMR and EDMR can be 8-10 orders of magnitude more sensitive which make them particularly useful for the investigation of defects in low dimensional material systems and thin-film devices. In recent years, there has been quite a significant progress with pODMR and pEDMR which provide quantitative access to spin-coherence times, coupling constants and inhomogeneities of the investigated defect systems.