Coherent x-ray scattering in an XPEEM setup

Abstract

X-ray photoemission electron microscopy has been one of the most productive x-ray microscopy tools with chemical and magnetic sensitivity. We demonstrate that an existing XPEEM setup can be readily adapted to simultaneously perform coherent x-ray scattering measurements in reflectivity mode. Photon-in photon-out x-ray scattering measurement provides the sensitivity to buried interfaces as well as the possibility to work under external fields not accessible in an electron-based measurement. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for a spin-ice lattice showing both chemical and magnetic contrast.