Combination of FTIR reflection absorption spectroscopy and work function measurement for in-situ studies of plasma modification of polymer and metal surfaces

Combination of FTIR Reflection Absorption Spectroscopy and Work Function Measurements for In Situ Studies of Plasma Modified Passive Films on MgZn2

“…For uniform modification of the surface the grounded sample was moved through the plasma zone at a constant velocity which determines the time of exposure. A commercial high voltage power supply was used to apply an alternating, pulsable, and adjustable voltage with a frequency of 30.7 kHz to two electrodes placed 25 mm above and parallel to the sample surface 16…”

“… Experimental setup of the combination of in situ FT‐IRRAS and KP with a plasma cell for detection of plasma induced modifications on MgZn 2 16…”

“…Such a dry plasma induced passive film formation would fit perfectly to either a continuous hot‐dip galvanizing or physical vapor deposition zinc alloy production line. Plasma processes are a well established technique for the cleaning and chemical activation of metal and polymer substrates12–14 and it has been previously demonstrated by the authors that reductive plasma treatments lead to a change in the chemistry of passive films on iron 15, 16…”

“…As reducing and oxidizing low temperature plasmas, audio frequency plasma at reduced pressure in either a hydrogen or oxygen atmosphere was applied. The effect of the different plasma chemistries on the alloy surface was studied by means of combined in situ infrared reflection absorption spectroscopy (IRRAS), work function measurement16 and ex situ X‐ray photoelectron spectroscopy (XPS). Changes to the passive film chemistry and work function were correlated with interfacial electrode potentials, measured by means of a scanning Kelvin probe (SKP) at the interface between a model polymer film and the plasma modified alloy surface in humid atmospheres.…”

Deposition of polysiloxane‐like nanofilms onto an aluminium alloy by plasma polymerized hexamethyldisiloxane: characterization by XPS and contact angle measurements

“…These species lead to a change in the surface chemistry, and ex situ techniques such as XPS and time-of-flight secondary ion mass spectrometry (ToF-SIMS) therefore do not really show the surface condition directly after the plasma modification. 34 This work deals with plasma cleaning (removal of contaminants) and activation (construction and/or enhancement of the oxides/hydroxides) of aluminium (Alclad 2024-T3) surfaces prior to the deposition of thin polysiloxane-like layers by plasma polymerization of HMDSO. These thin layers might be used for the adhesion of paint films (overcoating).…”