Combining design simulations with nano-probing to root-cause a processor device glitch issue

Teo, Chek Sing; Khatri, Dnyan; Wei, M. S.; Lim, Soon-Huat

doi:10.1109/ipfa.2015.7224321

2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits 2015

DOI: 10.1109/ipfa.2015.7224321

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Combining design simulations with nano-probing to root-cause a processor device glitch issue

Chek Sing Teo

Dnyan Khatri

M. S. Wei

et al.

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Combining design simulations with nano-probing to root-cause a processor device glitch issue

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