Common-path illumination in ESPI: enhancing sensitivity for measuring specular deformation

Yan, Peizheng; Liu, Xiangwei; Zhou, Xinda; Ba, Rongsheng; Zhou, Hanxuan; Wang, Yonghong; Li, Jie

doi:10.3788/col202422.081201

Chin. Opt. Lett.

2024

DOI: 10.3788/col202422.081201

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Common-path illumination in ESPI: enhancing sensitivity for measuring specular deformation

Peizheng Yan,

Xiangwei Liu,

Xinda Zhou

et al.

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Common-path illumination in ESPI: enhancing sensitivity for measuring specular deformation

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References 16 publications

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