2021
DOI: 10.1007/s12633-021-01181-6
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Comparative Analysis & Study of Various Leakage Reduction Techniques for Short Channel Devices in Junctionless Transistors: A Review and Perspective

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Cited by 17 publications
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“…Due to the bulk conduction mechanism, JLTs have less effect of surface roughness and defects. This results in much lesser noise and improved reliability [9][10].…”
Section: Introductionmentioning
confidence: 99%
“…Due to the bulk conduction mechanism, JLTs have less effect of surface roughness and defects. This results in much lesser noise and improved reliability [9][10].…”
Section: Introductionmentioning
confidence: 99%