Comparative Analysis of Electron Diffraction Pattern Obtained Without and With Precession System

Abstract

Electron diffraction is an additional technique in electronic microscopy studies. Since the XRD or neutron diffraction techniques was used intensely for crystalline structure determination, electron diffraction has potential for special cases were even this technique fails. Due to several factor the electron diffraction is not suitable for crystal structure determination, but with hardware and software improvement we can transform this technique in useful one. We show here an example of analysis of five different samples using combined technique, such as TEM/HRTEM image, electron diffraction without and with improvement provided by a precession system. We highlight the cases were electron diffraction succeed and the cases were failed, even the precession system is used.