Chinese Phys. Lett.
 2005
DOI: 10.1088/0256-307x/22/10/067
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Comparative Characterization of InGaN/GaN Multiple Quantum Wells by Transmission Electron Microscopy, X-Ray Diffraction and Rutherford Backscattering

Shengqiang Zhou1,
WU Ming-Fang2,
Yao Shu-De3
et al.
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Cited by 6 publications
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