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Selected prominent problems in the analysis of advanced ceramic materials are surveyed. The importance of reliability of results is discussed 10 the Held of elemental trace-and microanalysis in view of its interaction with economy, power of detection, local resolution and speciation selectivity. Particular probJems in U1e analysis of major constituents, trace components and microlocal distributions are based on the striking properties of ceramics; they are exemplified. Analytical assistance must start from the beginning of the production processing, in the preparation of the powdered base materials. Determination of the stoichiometry requires high accuracy and differentiation of chemical species in bulk and surface analysis of ceramic base powders. Element trace determination by direct instrumental methods requires standard reference materials for calibration; these are currently inavailable in a sufficient variety. For optimum reliability and power of detection, element traces must be prepared in isolated form in a small excitation volume for analysis.A review on the state-of-the-art of wet-chemical combined procedures is presented. Decomposition position procedures are emphasized, due to their risk of contributing severe systematic error. Combustion in elementary fluorine is presented for decomposition of refractory materials. The performance or some direct procedures is discussed. Very efficient methods are available for element trace determinations in ceramic materials, offering high detection power. Several approaches for high-resolution local microanalysis in non-conductive ceramic materials are identified as the most promising development in the analysis or sintered compact ceramic products and devices.
Selected prominent problems in the analysis of advanced ceramic materials are surveyed. The importance of reliability of results is discussed 10 the Held of elemental trace-and microanalysis in view of its interaction with economy, power of detection, local resolution and speciation selectivity. Particular probJems in U1e analysis of major constituents, trace components and microlocal distributions are based on the striking properties of ceramics; they are exemplified. Analytical assistance must start from the beginning of the production processing, in the preparation of the powdered base materials. Determination of the stoichiometry requires high accuracy and differentiation of chemical species in bulk and surface analysis of ceramic base powders. Element trace determination by direct instrumental methods requires standard reference materials for calibration; these are currently inavailable in a sufficient variety. For optimum reliability and power of detection, element traces must be prepared in isolated form in a small excitation volume for analysis.A review on the state-of-the-art of wet-chemical combined procedures is presented. Decomposition position procedures are emphasized, due to their risk of contributing severe systematic error. Combustion in elementary fluorine is presented for decomposition of refractory materials. The performance or some direct procedures is discussed. Very efficient methods are available for element trace determinations in ceramic materials, offering high detection power. Several approaches for high-resolution local microanalysis in non-conductive ceramic materials are identified as the most promising development in the analysis or sintered compact ceramic products and devices.
Herausgegeben von der Gesellschait Deutscher Chemiker Analytische A tomspe ktrome t r e Viereinhalb Jahre sind seit dem Erscheinen der letzten Marktubersichten zum Theme Atomspektrometrie vergangen [diese Nachr. 1989, 37, Sonderheft Spektroskopie], vie1 Zeit zur Weiterenf wicklung der wissenscha ftlichen Grundlagen der Methoden, aber auch der apparativen Ausfuhnrng und der Applikationen. Und auf Anwendungen liegt der Schwerpunkf des folgenden Berichts: Aktuelle Forschungsergebnisse in der Atomspektrometrie werden zusammenfassend dargestellt. Es schlieBt sich eine Tabelle an, in der 90 Gerate, d.h. die zur Messung niitige Hardware, nach Angaben aus Firmenprospekten knapp charakterisiert werden. Wir danken den Autoren, Prof Dr. Jose A. C. Broekaert und Dr. Norbert Jakubowski, Dortmund, sowie besonders Dr. Franz Leis, Dortmund, der unter groRem Einsatz die Geratedaten zusammengetragen hat, f i r ihre kompetente und engagierte Unterstufzung.
Die Oberflächen‐ und Tiefenprofilanalytik mittels Sekundärneutralteilchen‐Massenspektrometrie ist eine noch relativ junge Methode, die leicht zu interpretierende Spektren liefert. Neben der gängigen Plasma‐SNMS etablieren sich weitere interessante Varianten.
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