Comparison of split dislocation images obtained by the weak-beam method and lattice-resolution techniques

Maksimov, S. K.; Филиппов, А. П.; Gaidukov, G. N.; Heydenreich, J.; Khodos, I. I.

doi:10.1080/01418618708209872

Cited by 10 publications

(1 citation statement)

References 7 publications

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“…There has been extensive work performed on dislocations in diamond cubic (Alexander et al, 1987;Bourret and Desseaux, 1979;Bourret et al, 1982;Maksimov et al, 1987;Olsen and Spence, 1981) and ionic solids (Malloy et al, 1995;Zhang et al, 2004). Recent studies on dislocations in GaAs have demonstrated remarkable achievements in terms of resolution and the ability to distinguish core structures (Beckman et al, 2002;Tillmann et al, 2004).…”

Section: Introductionmentioning

confidence: 98%

HRTEM of dislocation cores and thin‐foil effects in metals and intermetallic compounds

Mills

Baluc

Sarosi

2006

Microscopy Res & Technique

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Examples of the observation and analysis of dislocation cores and dislocation fine structure in metals and intermetallics using high resolution transmission electron microscopy are discussed. Specific examples include the 60 degrees dislocations in aluminum, a011 edge dislocations in NiAl, and screw dislocations in Ni3Al. The effect of the thin TEM foils on the structure and imaging of these dislocations is discussed in light of embedded atom method calculations for several configurations and coupled with image simulations. Some generalizations based on these calculations are discussed. These analyses enables determination of the spreading or decomposition of the edge component of the cores, both in and out of the glide plane, which can have significant implications for the modeling of macroscopic behavior.

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Section: Introductionmentioning

confidence: 98%

HRTEM of dislocation cores and thin‐foil effects in metals and intermetallic compounds

Mills

Baluc

Sarosi

2006

Microscopy Res & Technique

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Calculation of displacement fields and simulation of HRTEM images of dislocations in sphalerite type A(III)B(V) compound semiconductors

Lazar

Wagner

1997

Cryst. Res. Technol.

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The displacement fields of different kinds of both perfect and dissociated dislocations have been calculated for an isotropic continuum, and by means of linear elasticity. Additionally, the corresponding HRTEM images have been simulated by the well-established EMS program package in order to predetermine the structural aspects of dislocations, and then to compare it with experimental HRTEM micrographs. The latter ones resulted from plastically deformed GaP single crystals and InAs/(OOl)GaAs single epitaxial layers. It could be established that using the simple approach of linear elasticity and isotropy results can be obtained which correspond well to the experimental images. So, the structure of various Shockley partial dislocations bounding a stacking fault can be detected unambiguously. The splitting behaviour of perfect 30" dislocations (separation into a 0" and 60" partial) and 90" dislocations (separation into two 60" partials) both with line direction along (112), 60" dislocations (separation into 3Oo/9O6 and 90"/30" configuration) and screw dislocations (separation into two 30" partials) along (110) are discussed in the more detail. Moreover, the undissociated sessile Lomer dislocation, glissile 60" dislocation and edge dislocation have been considered too.

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High-Resolution Microscopy of Dissociated Screw Dislocations in GaAs

Cooman

Carter

1989

Phys. Stat. Sol. (a)

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The structure of dissociated screw dislocations in GaAs is analyzed by high‐resolution electron microscopy and image simulation. The stacking fault is invariably found to be intrinsic with a stacking‐fault energy of (45 ± 6) mJ/m2. The comparison between experimental and simulated images suggests that partial dislocation motion occurs during observation and the interaction of the dislocation core with point defects severely limits the determination of the dislocation core structure in terms of “glide” or “shuffle” models.

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Comparison of split dislocation images obtained by the weak-beam method and lattice-resolution techniques

Cited by 10 publications

References 7 publications

HRTEM of dislocation cores and thin‐foil effects in metals and intermetallic compounds

HRTEM of dislocation cores and thin‐foil effects in metals and intermetallic compounds

Calculation of displacement fields and simulation of HRTEM images of dislocations in sphalerite type A(III)B(V) compound semiconductors

High-Resolution Microscopy of Dissociated Screw Dislocations in GaAs

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