Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices

Ortiz-Rodríguez, J.M.; Hefner, Allen R.; Berning, D.W.; Hood, C.; Ölçüm, Selim

doi:10.1109/compel.2006.305630

2006 IEEE Workshops on Computers in Power Electronics 2006

DOI: 10.1109/compel.2006.305630

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Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices

J.M. Ortiz-Rodríguez

Allen R. Hefner

D.W. Berning

et al.

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Computer-Controlled Characterization of High-Voltage, High-Frequency SiC Devices

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