Abstract:The experimental properties analyzed in Part I of this study are compared with a theoretical analysis of carrier recombination through multiple levels already published by the author. This suggests the possibility of a model of the number theory type. A trap for the electron carriers is located at 0.13 ev below the conduction band and a recombination level at 0.10 ev below the trap level. The Fermi and the recombination levels are coincident. The number of trapping centers is about 1018cm−3, and the number of … Show more
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