2001
DOI: 10.1016/s0007-8506(07)62996-5
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Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years

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Cited by 45 publications
(14 citation statements)
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“…The history of surface texture measurement can be found elsewhere [11,71,118,145,189,193] and this section will highlight some of the important developments, specifically in calibration and performance verification. One of the earliest attempts at controlling surface texture was made in the USA by a company that mounted samples of textures produced by different methods in cases [157] which were given to the machinist, who was expected to obtain a texture on his or her workpiece as near to that specified as possible.…”
Section: Historymentioning
confidence: 99%
“…The history of surface texture measurement can be found elsewhere [11,71,118,145,189,193] and this section will highlight some of the important developments, specifically in calibration and performance verification. One of the earliest attempts at controlling surface texture was made in the USA by a company that mounted samples of textures produced by different methods in cases [157] which were given to the machinist, who was expected to obtain a texture on his or her workpiece as near to that specified as possible.…”
Section: Historymentioning
confidence: 99%
“…Considering the tribological characteristics of the elements of friction pairs, the crucial quantities describing the surface layer condition, among the stereometric parameters, are roughness and directionality, while for the physicochemical type of material these are structure, internal stresses and hardness [10][11].…”
Section: Condition Of the Surface Layermentioning
confidence: 99%
“…The Esystem gains its basis from the simulation of the contact phenomenon of two mating surfaces, whereby peak features of the surface play a principal role in the interaction operation, see Fig.2. Between 1955 and 1966 [18], some arguments between the M-system and the E-system in terms of their capability and superiority have been made. When that time, the difficulty appeared in building practical instruments for the E-system as two elements were needed: a spherical skid to approximate the enveloping circle" and a needle-shaped stylus moving in a diametral hole of the skid to measure the surface waviness or roughness as deviation with respect to the generated envelope.…”
Section: Backgrounds and Motivationsmentioning
confidence: 99%