2011 12th European Conference on Radiation and Its Effects on Components and Systems 2011
DOI: 10.1109/radecs.2011.6131377
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Contribution to SER prediction: A new metric based on RC transient simulations

Abstract: This work provides a new metric for SEU reliability studies. This metric is based on transient I-V responses extracted from a RC analytical model, in order to detect a SEU threshold.

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