2015
DOI: 10.1039/c5cp01436k
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Controlled growth of large area multilayer graphene on copper by chemical vapour deposition

Abstract: The growth of nearly full coverage of multilayer graphene on the surface of a 99.8% purity copper foil has been experimentally studied. It has been shown that the film thickness can be controlled by a single parameter, the growth time, and growth can be extended until nearly full coverage of more than one layer graphene over the copper surface. The results are supported by scanning electron microscopy and Raman analysis together with optical transmittance and sheet resistance measurements. It has been verified… Show more

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Cited by 25 publications
(17 citation statements)
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“…1 b) as multilayer islands on a fully closed monolayer film. Similar to literature 42 , 43 some white dots are present in the SEM image, which are most likely related to an oxidation process of Ge as described in a recent study 17 . Obviously, the graphene film is defective with an I D / I G ratio of 0.7.…”
Section: Resultssupporting
confidence: 85%
“…1 b) as multilayer islands on a fully closed monolayer film. Similar to literature 42 , 43 some white dots are present in the SEM image, which are most likely related to an oxidation process of Ge as described in a recent study 17 . Obviously, the graphene film is defective with an I D / I G ratio of 0.7.…”
Section: Resultssupporting
confidence: 85%
“…These particles are a compound of silicon and oxygen, originated from the quartz tube of the furnace. 17,3941 It can be clearly seen that SiO x particles are never sited at the center of GFs at the earlier stages of graphene growth. Therefore, we infer that silicon oxide particles are not the initial cause of graphene nucleation.…”
Section: Resultsmentioning
confidence: 99%
“…identified the contaminants as SiO 2 clusters and indicated the phase transition of quartz (occurring during the CVD process) as responsible for the contamination process: SiO 2 is emitted from the quartz tube when Cu atoms (originating from the Cu substrates during heating) diffuse inside the tube walls at the α/β quartz phase transition temperature (573 °C) 37 . Other authors attributed the SiO x contamination to the presence of silicon (Si) in the bulk of the Cu substrates, which in their view would emerge during the growth process and contaminate the graphene surface 38 . A third group linked the presence of SiO 2 clusters on graphene to the reaction of hot hydrogen with the quartz reactor 39 : During the annealing of the Cu substrate the hot part of the tube furnace would be etched by H 2 gas, depositing SiO 2 on the substrate.…”
Section: Introductionmentioning
confidence: 99%