Materials, Active Devices, and Optical Amplifiers 2004
DOI: 10.1117/12.521647
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Correlation between the g-r noise in semiconductor lasers and device reliability

Abstract: The g-r noise in semiconductor lasers and its relation with device quality and reliability are studied. The results indicated that g-r noise has close relation with semiconductor defects, the devices with g-r noise degrade rapidly during electric aging, the P-I characteristics of the devices evidently become bad, or the devices have failed after aging. By measuring g-r noise in semiconductor lasers, the devices quality and reliability can be estimated, which is an effective and non-destructive method.

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“…The single-segment method is appropriate for modelling of evaporator when the specific heat of the fluid in the heat exchanger does not change with temperature. A zone modelling technique can be used where the evaporator has three distinct phases: liquid, liquid-vapor and superheat zone (Quoilin et al, 2010;Tian et al, 2012;Wang et al, 2012;Zhang et al, 2012and Hou et al, 2011. The heat transfer equations in each zone are solved by applying this method.…”
Section: Evaporatormentioning
confidence: 99%
“…The single-segment method is appropriate for modelling of evaporator when the specific heat of the fluid in the heat exchanger does not change with temperature. A zone modelling technique can be used where the evaporator has three distinct phases: liquid, liquid-vapor and superheat zone (Quoilin et al, 2010;Tian et al, 2012;Wang et al, 2012;Zhang et al, 2012and Hou et al, 2011. The heat transfer equations in each zone are solved by applying this method.…”
Section: Evaporatormentioning
confidence: 99%