Corrigendum to “WDP-BNN: Efficient wafer defect pattern classification via binarized neural network” [Integration 85 (2022) 76–86]

Zhang, Qing; Zhang, Yuhang; Li, Jizuo; Li, Yongfu

doi:10.1016/j.vlsi.2022.09.001

Integration

2023

DOI: 10.1016/j.vlsi.2022.09.001

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Corrigendum to “WDP-BNN: Efficient wafer defect pattern classification via binarized neural network” [Integration 85 (2022) 76–86]

Qing Zhang

Yuhang Zhang

Jizuo Li

et al.

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Corrigendum to “WDP-BNN: Efficient wafer defect pattern classification via binarized neural network” [Integration 85 (2022) 76–86]

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