1969
DOI: 10.1126/science.163.3869.817
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Critical Point Drying for Scanning Electron Microscopic Study of Ciliary Motion

Abstract: Scanning electron microscopic study of tile pattern of ciliary coordination and the form of the ciliary beat is now possible. Rapid fixation stops tile ciliary activity instantaneously, and critical point drying avoids distortion of the cilia by surface tension forces. Such stuidies have been made on the ciliate Opalina with this new technique.

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Cited by 216 publications
(102 citation statements)
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“…Em seguida, foram desidratadas pelo método do ponto crítico de CO 2 (Horridge & Tamm 1969) e montadas sobre suportes de alumínio e cobertas com uma camada de ouro de 30 a 40 nm. As observações foram feitas ao microscópio eletrônico de varredura modelo LEO VP 435, operado a 20 kV.…”
Section: Methodsunclassified
“…Em seguida, foram desidratadas pelo método do ponto crítico de CO 2 (Horridge & Tamm 1969) e montadas sobre suportes de alumínio e cobertas com uma camada de ouro de 30 a 40 nm. As observações foram feitas ao microscópio eletrônico de varredura modelo LEO VP 435, operado a 20 kV.…”
Section: Methodsunclassified
“…Para as análises ultra-estruturais, amostras do rizoma de três indivíduos de cada tratamento foram fi xadas em solução de Karnovsky (Karnovsky 1965), desidratadas em série etílica, secas pelo método do ponto crítico de CO 2 (Horridge & Tamm 1969), montadas sobre suportes de alumínio e metalizadas com ouro coloidal por 210 segundos. As observações e as eletromicrografi as foram feitas ao microscópio eletrônico de varredura LEO modelo VP 435, operado a 20 kV, com as escalas diretamente impressas nas mesmas.…”
Section: Methodsunclassified
“…These materials were fixed for 30 minutes in 10% paraformaline solution, then dehydrated in acetone and finally embedded in epoxy resin (Epon-812). Some sections were etched with 0.1 N HC1 for 15-16 sec., dehydrated in ethyl alcohol and then dried by a critical point drying method (Horridge and Tamm, 1969). They were coated with a 1.5-nm gold-palladium layer and observed under a Hitachi X-560 scanning electron microscope (SEM).…”
Section: Methodsmentioning
confidence: 99%