Crystalline Volume Fraction Effect on the Electronic Properties of Hydrogenated Microcrystalline Silicon (c-Si:H Investigated by Ellipsometry and AMPS-1D Simulation

Benhabara, H.; Sib, J.D.; Bouhekka, Ahmed; Chahi, M.; Benlakhel, D.; Kebbab, A.; Bouizem, Y.; Chahed, L.

doi:10.21272/jnep.11(1).01014

J. Nano- Electron. Phys.

2019

DOI: 10.21272/jnep.11(1).01014

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Crystalline Volume Fraction Effect on the Electronic Properties of Hydrogenated Microcrystalline Silicon (c-Si:H Investigated by Ellipsometry and AMPS-1D Simulation

H. Benhabara¹,

J.D. Sib²,

Ahmed Bouhekka³

et al.

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Crystalline Volume Fraction Effect on the Electronic Properties of Hydrogenated Microcrystalline Silicon (c-Si:H Investigated by Ellipsometry and AMPS-1D Simulation

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