D. Sayre, M. Howells, J. Kirz, M. Rarback (eds). X‐Ray microscopy II. Springer Series in Optical Sciences, Vol. 56. Springer‐Verlag, Berlin Heidelberg, New York, London, Paris, Tokyo 1988, 454 pages, 306 figures, DM 114,–, ISBN 3‐540‐19‐392‐8