2015
DOI: 10.5140/jass.2015.32.3.167
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DC Langmuir Probe for Measurement of Space Plasma: A Brief Review

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Cited by 26 publications
(20 citation statements)
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“…In the nightside, the variation of T e at the higher altitudes and the deviation from the empirical model are even larger. Though the derivation of T e from the Langmuir probe is not straightforward because of the contamination problem [ Oyama , ], the large variation of T e at the topside ionosphere itself is an existent feature and this implies that T e can provide more informations than N e about the evolution history of the topside ionosphere in terms of plasma drift and heating or cooling processes by conduction or convective mixing.…”
Section: Discussion: Comparison With Ionospheric Modelsmentioning
confidence: 99%
“…In the nightside, the variation of T e at the higher altitudes and the deviation from the empirical model are even larger. Though the derivation of T e from the Langmuir probe is not straightforward because of the contamination problem [ Oyama , ], the large variation of T e at the topside ionosphere itself is an existent feature and this implies that T e can provide more informations than N e about the evolution history of the topside ionosphere in terms of plasma drift and heating or cooling processes by conduction or convective mixing.…”
Section: Discussion: Comparison With Ionospheric Modelsmentioning
confidence: 99%
“…The plasma density, can also be derived from the faceplate (FP) on-board Swarm as part of the TII instrument. The FP, similarly to a planar Langmuir Probe (Oyama, 2015), measures the current with a cadence of 16 Hz. The electron density N e is derived from FP current measurements only for certain orbits per day, namely when the TII is not active.…”
Section: Baseline 05mentioning
confidence: 99%
“…To CSES LAP, we mainly use the up-sweeping phase to retrieve the plasma parameters (Yan, Guan, et al, 2018). The Writing -original draft: Rui Yan, Yibin Guan Writing -review & editing: Zeren Zhima, Chao Xiong, Xuhui Shen down-sweeping phase is commonly used to check whether the probe is contaminated or not, for the contamination has a more visible effect on the I-V curves during the down-sweeping phase (Oyama, 2015). To CSES LAP, The fixed bias-voltage phase is used for experiments or instrument performance tests.…”
Section: Satellite and Instrumentmentioning
confidence: 99%