Phys. Chem. Chem. Phys.
 2022
DOI: 10.1039/d1cp04173h
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Decomposing and analyzing contact resonance frequency in contact mode voltage modulated scanning probe microscopies

Yue Liu
1
,
Bingxue Yu
2
,
Hongli Wang
3
et al.

Abstract: PCA analysis has been performed on a frequency image during SS-PFM measurements and interesting correlations were found among the different images for ferroelectric materials.

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