2007
DOI: 10.1063/1.2734477
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Deep levels controlling the electrical properties of Fe-implanted GaInP∕GaAs

Abstract: The authors investigated the electrical compensation induced by deep levels introduced in metal organic vapor phase epitaxy grown n+-InGaP∕GaAs epitaxial layers by high temperature Fe implantation. The activation of the Fe2+-related deep levels has been assessed by current-voltage analyses performed at different temperatures. In the framework of the space charge limited current model, they determined the energy location in the gap of the deep levels that control the electrical properties of the semi-insulating… Show more

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Cited by 6 publications
(4 citation statements)
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“…6 The results of this analysis are summarized in Fig. 6 The results of this analysis are summarized in Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…6 The results of this analysis are summarized in Fig. 6 The results of this analysis are summarized in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…In particular, the nature of the traps ͑donor or acceptor͒ and their energy location in the band gap can be obtained. 6. The J-V-T curves have been analyzed at the two fixed voltages, 0.1 V ͑Ohmic region͒ and 0.9 V ͑SCLC region͒, indicated by the arrows in Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…It is known that artificial non-oxide compounds produced for the use in the green energy technology, modern electronics and optics and thin chemistry technologies often contain heavy metals and chemical elements toxic to humans and the environment [1][2][3][4][5][6][7][8][9]. The products of their transformation/degradation induced by the contact with the chemically active air components and temperature variation may be dangerous.…”
Section: Introductionmentioning
confidence: 99%