DOI: 10.32657/10356/66016
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Defect characterization of low temperature solution grown ZnO

Abstract: to Denny, Quang and Ajay for advice and help rendered with the various characterization equipment, growth techniques, data processing and writing; and all my lab-mates and students for their help. I would also like to thank Connie and Andrew for help with formatting and editing of this thesis.

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