2021
DOI: 10.2528/pierm21081501
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Design and Optimization of a Tem Cell Structure Suitable for Wider Bandwidth

Abstract: Transverse electromagnetic (TEM) cell is usually used to evaluate the electromagnetic immunity and electromagnetic radiation disturbance of the equipment under test (EUT) and integrated circuit (IC). Affected by the structure of the TEM cell, high-order modes and reflection will be generated in the high frequency range, which will limit the higher frequency applications of the TEM cell. In this paper, the TEM cell specified in IEC61967-2 standard is improved by adopting several methods, including segmented imp… Show more

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