2013
DOI: 10.1109/tmtt.2013.2260171
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Design and Power Performance Measurement of a Planar Metamaterial Power-Combined Amplifier

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Cited by 3 publications
(6 citation statements)
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“…Due to the power capability limitations in SSPAs, power combining techniques have been introduced to combine multiple SSPAs outputs for achieving a high output power . Therefore, different power divider/combiner structures have been developed to achieve a low loss and high power combining efficiency …”
Section: Introductionmentioning
confidence: 99%
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“…Due to the power capability limitations in SSPAs, power combining techniques have been introduced to combine multiple SSPAs outputs for achieving a high output power . Therefore, different power divider/combiner structures have been developed to achieve a low loss and high power combining efficiency …”
Section: Introductionmentioning
confidence: 99%
“…Power combining techniques mainly use N ‐way structures with different characteristics/configurations to obtain the desired output power. Depending on the desired properties, the existing configurations are classified into two main groups; binary structure (eg, planar microstrip Wilkinson), and parallel structure (eg, radial and spatial combiners) . The conventional planar binary structures such as T‐junction, Wilkinson, branch‐line, and ring coupler can produce good isolation and a broadband power combining with more than 100% fractional bandwidth .…”
Section: Introductionmentioning
confidence: 99%
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“…Specifically, the PRI material is composed of 2-D RH unit cells, while the ZRI material is realized by arranging 2-D RH and LH unit cells in a checkerboard tessellation [8], or by using only LH unit cells operated at the infinite wavelength frequency to give the zero-phase shift characteristic [9]. This paper investigates the degradation characteristic of a planar nine-way metamaterial power-combined amplifier [10] with device failures. Due to its uniform isolation characteristics of the metamaterial powerdividing/combining structure [9], the graceful degradation performance of this power-combined amplifier is shown to be independent of the amplifier failure sequence.…”
Section: Introductionmentioning
confidence: 99%