Design and Simulation of a Semiconductor Detector-Based Compton Imaging System with Efficiency Analysis

Abstract

Compton cameras detect scattered gamma rays and estimate the distribution of gamma-ray sources. Nonetheless, crafting a camera tailored to a specific application presents formidable challenges, often necessitating the implementation of diverse image reconstruction techniques. Delving into the factors influencing these cameras can pave the way for design optimization and performance enhancement. This study introduces an inventive detector design for Compton imaging systems, building upon the achievements of prior designs. The proposed system contains eight scatterer detectors and a semiconductor absorber detector, spaced at 1 mm and 30 mm intervals, respectively. The source-to-first-scatterer-detector distance is 5 mm, with scatterer and absorber detector plates measuring 70× 70× 2.125 mm3 and 70× 70× 10 mm3, respectively. Geant4 simulation toolkit models the Compton imaging system, and an analytical method reconstructs Compton camera images. Unlike more straightforward techniques, the analytical method directly reconstructs Compton camera images by solving the equation relating to the reflected image data. This approach is implemented in the C++ programming language. The study's findings reveal that the analytical method discerns optimal conditions and parameters that significantly influence efficiency, yielding a full width at half maximum (FWHM) of 3.7 mm with an angular uncertainty of approximately 2.7 degrees at an energy level of 0.662 MeV. Compared to another experimental design employing the analytical image reconstruction approach, the FWHM value decreased by 0.7 mm. This study presents an innovative detector design and an analytical reconstruction method for Compton imaging systems, showcasing improved efficiency and accuracy.