Design Diagnosis with E-Beam Probing to Improve Reliability Issue Due to Competitive Signal Error

Abstract

Tiny circuit design reliability issue related to competitive signal was investigated in a sense amplifier (SA) circuitry of SRAM by E-Beam probing technique in this paper. The irregular output signals then traced back to former stage circuit and identified associated waveforms. With such design concept and technique tracing, the invisible and cunning circuit mismatch reliability issue could be revealed successfully.