Design of low cost ROM based test generators

Edirisooriya, G.; Robinson, John P.

doi:10.1109/vtest.1992.232725

Cited by 12 publications

(3 citation statements)

References 4 publications

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“…In general, they can be classified as ROM-based deterministic, algorithmic, exhaustive and pseudo-random. In the first approach, deterministic patterns are stored in a ROM and a counter is used for their addressing, (Edirisooriya & Robinson, 1992). The approach is limited to small test pattern sets.…”

Section: Introductionmentioning

confidence: 99%

Stochastic Approach to Test Pattern Generator Design

Papa¹

2011

Stochastic Optimization - Seeing the Optimal for the Uncertain

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Section: Introductionmentioning

confidence: 99%

Stochastic Approach to Test Pattern Generator Design

Papa¹

2011

Stochastic Optimization - Seeing the Optimal for the Uncertain

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“…They can be classified as ROM-based deterministic, algorithmic, exhaustive and pseudo-random. In the first approach, deterministic patterns are stored in a ROM and a counter is used for their addressing, [12]. This approach is limited to small test pattern sets.…”

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confidence: 99%

Genetic algorithm for test pattern generator design

Papa

2010

Appl Intell

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The paper describes an approach for the generation of a deterministic test pattern generator logic, which is composed of D-type and T-type flip-flops. This approach employs a genetic algorithm that searches for an acceptable practical solution in a large space of possible implementations. In contrast to conventional approaches the proposed one reduces the gate count of a built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution. The optimization includes the search for: the optimal combination of register cells type; the presence of inverters at inputs and outputs; the test patterns order in the generated test sequence; and the bit order of test patterns. Results of benchmark experiments and comparison with similar studies demonstrate the efficiency of the proposed evolutionary approach.

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“…Usually Read Only Memories (ROMs) are used to store the test patterns. Furthermore several hybrid schemes have been proposed which attempt to exploit favorable features of each of the above schemes[13,14,27].Many compaction schemes have been proposed to reduce the volume of output test data; parity checking [3],…”

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confidence: 99%